Nan Deng

Nan Deng is a Ph.D. candidate at Technische Universität Ilmenau in Germany. Her research focused on developing novel nanoscale sensors for high-precision metrology. She is currently working on the research topic of Moiré atomic force sensors for robust nanoscale sensing, which has applied the optical Moiré effect on AFM scanning with high resolution. Her work is expected to make significant contribution to the field of nanometrology.